Electrical characterisation
Electrical characterisation
For electrical devices, MEMS, and solar cells, the electrical properties are often what dictates whether the device is performing as expected. As such there are a range of ways to understand different aspects of these properties.
List of available equipment
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
15 Tesla superconducting cryogenic magnet system
High field superconducting magnet with integrated variable temperature stage
University of Western Australia
WA Node
Description
Measure the carrier concentration and mobility of semiconductor samples at various temperatures using the Hall Effect
Related Information
Resistivity and Hall Effect measurement: conventional probe - temperature range (3-320K); high temperature probe - temperature range (295-600K); optical fibre probe - dark and under steady-state laser illumination @ 1530nm.
Tool Contact
anff-wa@uwa.edu.au
2 Tesla electromagnet system
Electromagnet
University of Western Australia
WA Node
Description
Measure the carrier concentration and mobility of semiconductor samples using the Hall Effect
Related Information
Allows Hall-Effect characterization of semiconductor samples down to liquid Nitrogen temperatures and magnetic field intensity up to 2 Tesla.
Tool Contact
anff-wa@uwa.edu.au
Agilent Technologies 4156A Semiconductor Parameter Analyzer
Semiconductor parameter analyser
University of Western Australia
WA Node
Description
Digital sweep parameter. Used for failure analysis and automated incoming inspection.
Related Information
Features four built in source measurement units (SMUs), two voltage monitor units (VMUs) and two Voltage Source Unit (VSU). Current resolution to 1fA and the accuracy of to 20fA.
Tool Contact
anff-wa@uwa.edu.au
AutoLab Potentiostat
More information to come.
Melbourne Centre for Nanofabrication
VIC Node
Description
Precision potentiostat for electrochemical measurements
Related Information
A potentiostat is an analytical instrument designed to control the working electrode's potential in a multiple electrode electrochemical cell.
Tool Contact
mcn-enquiries@nanomelbourne.com
B1500A Analyzer- Agilent Technologies
Semiconductor Device Analyser
QLD Node
University of Queensland
Description
Testing of organic and electronic circuits. Provides IV, CV and pulsed measurements of conductive, capacitive, inductive or semiconductor samples
Related Information
Measurements functions: Sweep/spot, multichannel sweep, list sweep, time sampling, quasi-static CV, high frequency CV (to 5 MHz) and a direct control mode. Easyexpert is also supplied with an extensive library of over 230 application tests.
Tool Contact
anff@uq.edu.au
Custom Probe Station
Four point probe
NSW Node
University of New South Wales
Description
four point probe
Related Information
More information to come.
Tool Contact
anff@unsw.edu.au
Electrochemical Suite- Gamry Potentiostats
Electrochemical Testing
Flinders University
SA Node
Description
Eletrochemical Suite for the measurement of the electrical properties of materials for applications such as electrochemical corrosion and battery testing.
Related Information
Potentiostats able to perform many differernt electrochemical tests such as charge/discharge cycles on batteries, cyclic voltammetry, electrochemical impedance spectroscopy (EIS), and corrosion tests.
Tool Contact
Jason.Gascooke@flinders.edu.au
External quantum efficency measure- Custom EQE
External quantum efficiency (EQE) measurement system
Materials Node
University of Newcastle
Description
A measurement system to determine the ability of a solar cell to convert incident photons into electrons at varying wavelengths. Designed to integrate with lab scale devices, this custom system scans from 300 to 1,100 nm and has capacity to extend further in the spectrum.
Related Information
Standard sample size is 12.5 x 17.5 cm.
Tool Contact
anff@newcastle.edu.au
Four Point Probe- Keithlink
Probe station
QLD Node
University of Queensland
Description
Provides sheet resistance measurements of metal oxide thin films.
Related Information
Uses high input impedance meter to measure voltage drop when current applied by other two probes.
Tool Contact
anff@uq.edu.au
Four-Point Probe
More information to come.
Melbourne Centre for Nanofabrication
VIC Node
Description
Jandel multi-height probe stand provides a solution for a wide variety of measurements such as sheet and bulk resistance of the sample. The probe mechanism can be raised and lowered meaning that samples ranging in thickness from thin films to large ingots can be measured.
Related Information
Jandel Engineering Limited offers the RM3000 for use in making four point probe measurements. The RM3000 can supply constant currents between 10nA and 99.99mA, and measure voltages from 0.01mV to 1250mV. For sheet resistance measurements the quoted range is 1 milliohm/square to 5 x 10 (8) ohms/square. For volume (bulk) resistivity measurements the quoted range is 1 milliohm.cm to 1 x 10(6) ohm.cm.
Tool Contact
mcn-enquiries@nanomelbourne.com
Gooch and Housego OL 750 Spectroradiometric Measurement System
Infrared photodetector responsivity measurement system
University of Western Australia
WA Node
Description
Measures the electrical output per optical input of photodetectors.
Responsivity measures the input–output gain of a detector system. In the specific case of a photodetector, it measures the electrical output per optical input. Most of the photodetectors have strong spectral selectivity in a certain spectrum area. Therefore, for one photodetector, different wavelengths have different spectral responsivity. The spectral responsivity is an important parameter index for characterizing the photodetector performance.
Related Information
Infrared wavelength range characterisation
Tool Contact
anff-wa@uwa.edu.au
Hewlett Packard 3566A dynamic signal analyzer
Spectrum/Network analyzer
University of Western Australia
WA Node
Description
Performs data acquisition, FFT based analysis, raw data recording and report generation for vibration and noise measurement, structural modal test, rotating machinery diagnostics and acoustics.
Measures signals in the frequency domain, allowing to characterise how much energy is present at particular frequencies
Related Information
For fast measurement processing, a powerful hardware signal processor module converts time data to frequency domain data using FFT (Fast Fourier Transform) technology
Tool Contact
anff-wa@uwa.edu.au
Hewlett Packard 4156A parameter analyzer
Parameter analyzer
University of Western Australia
WA Node
Description
All-in-one unit, that consists of power supplies, voltage meters, current meters, switching matrices and LCR meters to test semiconductors devices. Can measure and analyse electrical characteristics of many types of electronic devices, materials, active or passive components, semiconductors, or other kind of electronic equipment.
Related Information
Allows low resistance and low current measurements with voltage resolution down to 0.2 micro volts.
Tool Contact
anff-wa@uwa.edu.au
Janis ST-100-UHT-5TXKEL low temperature probe station
Ultra high vacuum micromanipulated probe station
University of Western Australia
WA Node
Description
Used to characterise microelectronic devices in cryogenic and vacuum conditions. Allows non-destructive vacuum and cryogenic probing of wafers (up to 2”) and devices. Micro manipulated triaxial probe arms allow for easy positioning and extremely low leakage current for accurate measurements.
Related Information
Allows low-noise measurements at temperatures ranging from 3.5 Kelvin to 450 Kelvin
Tool Contact
anff-wa@uwa.edu.au
Keithley 4200A-SCS parameter analyzer
Parameter analyzer
University of Western Australia
WA Node
Description
All-in-one unit, that consists of power supplies, voltage meters, current meters, switching matrices and LCR meters to test semiconductors devices. Can measure and analyse electrical characteristics of many types of electronic devices, materials, active or passive components, semiconductors, or other kind of electronic equipment.
Related Information
Allows current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterization.
Tool Contact
anff-wa@uwa.edu.au
Lakeshore 336 temperature controller
Cryogenic temperature controller
University of Western Australia
WA Node
Description
Used to control the temperature of semiconductor samples during cryogenic measurements. Cryogenic temperature control unit used to measure and control the temperature of semiconductor samples during cryogenic measurements.
Related Information
Can operate down to 300 mK. Autotuning of PID parameters possible.
Tool Contact
anff-wa@uwa.edu.au
Microelectronics/RF Probe Station
More information to come.
Melbourne Centre for Nanofabrication
VIC Node
Description
Microelectronics chacterisation probe station and microscope w/ RF probes
Related Information
More information to come.
Tool Contact
mcn-enquiries@nanomelbourne.com
Network analyser
More information to come.
Melbourne Centre for Nanofabrication
VIC Node
Description
Network/spectrum analsyer- 9 KHz to 13.6 GHz
Related Information
The R&S ZVL is a compact, powerful, and future-proof network analyser which combine the functions of a network analyzer, spectrum analyzer, and power meter in a single box, and thus tremendously increase work efficiency.
Tool Contact
mcn-enquiries@nanomelbourne.com
NKT Photonics SuperK Super Continuum
Photonics Characterisation Suite - Source
Macquarie University
Optofab Node
Description
Super continuum source for optical characterisation.
Related Information
Operates in the visible and near IR regimes.
Tool Contact
benjamin.johnston@mq.edu.au
Optronic Laboratories Inc. OL 480 Blackbody Source
Blackbody calibration standard
University of Western Australia
WA Node
Description
Emits blackbody radiation for characterizing responsitivity of photodetectors. The OL 480 serves as an accurate, variable temperature (100 to 1200°C) blackbody calibration standard. It is extremely useful for calibrating infrared radiometric and spectroradiometeric measurement systems. The OL 480 has an emmisivity of 0.99 ± 0.01 and an uncertainty in the digital temperature readout of ± 2°C.
Related Information
Accurate and variable temperature (100 to 1200°C) blackbody calibration standard with emmisivity of 0.99 ± 0.01 and an uncertainty in the digital temperature readout of ± 2°C.
Tool Contact
anff-wa@uwa.edu.au
Parameter Analyser
More information to come.
Melbourne Centre for Nanofabrication
VIC Node
Description
The 4200A-SCS is a customizable and fully-integrated parameter analyzer that provides synchronized insight into current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterization.
Related Information
The highest performance parameter analyzer, the 4200A-SCS accelerates semiconductor, materials, and process development. The 4200A-SCS ClariusTM GUI-based Software provides clear, uncompromised measurement and analysis capability. Furnished with embedded measurement expertise and hundreds of ready-to-use application tests, Clarius Software enables to dig deeper into R & D with speed and confidence. The 4200A-SCS Parameter Analyzer is completely customizable and fully upgradable, so one can add the instruments one's need now – or later.
Tool Contact
mcn-enquiries@nanomelbourne.com
Probe Station- Karl Suss PM5
Probe station
NSW Node
University of Sydney
Description
4 probe DC probe station for measuring electrical properties of materials and devices.
Related Information
Substrate size up to 6 inch wafer. Can heat substrate up to 120 degrees centigrade during measurement.
Tool Contact
rpf.queries@sydney.edu.au
Probe station- Semiprobe SA-6
Probe station
QLD Node
University of Queensland
Description
Used to probe optoelectronic and semiconductor materials. Integrated into a glovebox system.
Related Information
4 probe DC probe station for measuring electrical properties of materials and devices. Substrate size up to 6 inch wafer.
Tool Contact
anff@uq.edu.au
Pulse Instruments 7700
Imaging test station
University of Western Australia
WA Node
Description
Characterises the imaging performance of infrared arrays. Carries out radiometric testing of imaging focal plane arrays.
Related Information
Turnkey system with ultra low noise architecture imaging test station providing real-time imaging and correction.
Tool Contact
anff-wa@uwa.edu.au
PV Measurements- QEX7
Quantum efficiency and spectral response measurement system for solar cell measurement
QLD Node
University of Queensland
Description
This Quantum Efficiency(QE)/Spectral Response(SR)/Incident Photon to Current Conversion Efficiency(IPCE)/IV Measurement System is a low-cost, high-performance quantum efficiency measurement system for solar cell analysis. Supplies a calibrated light intensity over known spectrum for testing solar cell efficiency and performance.
Related Information
Scan range 300 - 1100 nm. High resolution scan in <1 min. Probe beam between 1-20 mm. AC and DC measurement modes. Chopping Frequency 1 - 120Hz. Integrated IV measurement.
Tool Contact
anff@uq.edu.au
Rucker & Kolls 680A Prober
Semi-automatic wafer probe station
University of Western Australia
WA Node
Description
Probe station with B&L Microzoom
Related Information
6 inch chuck with 6 x 6 inch travel. Programmable automatic stepping. Manual mode motorised movement.
Tool Contact
anff-wa@uwa.edu.au
Solar Simulator- G2V Sunbrick
Solar Simulator
Flinders University
SA Node
Description
LED Solar Simulator including UV wavelengths down to 350nm. LED intensities can be tuned to simulate various solar spectra experienced on earth.
Related Information
UV-VIS LED solar simulator 300 x 300 mm area. Adjustable solar spectrum to mimic conditions at any lattitde on Earth.
Tool Contact
Jason.Gascooke@flinders.edu.au
Solar simulator- Newport Oriel
Solar simulator
Materials Node
University of Newcastle
Description
Tool for comparing the performance of solar cells under standardised conditions
Related Information
AM1.5 AAA rated, 1000W. 25 mm2 centre region. 50 mm collimated beam.
Tool Contact
anff@newcastle.edu.au
Stanford systems SR 560 low noise pre-amplifier
Low-noise voltage preamplifier
University of Western Australia
WA Node
Description
Amplifies a very low-power signal without significantly degrading its signal-to-noise ratio
Related Information
High-performance, low-noise preamplifier that is ideal for a wide variety of applications including low-temperature measurements, optical detection, and audio engineering.
Tool Contact
anff-wa@uwa.edu.au
Stanford systems SR 570 low noise current amplifier
Low-noise current preamplifier
University of Western Australia
WA Node
Description
Amplifies very low-power signals without significantly degrading their signal-to-noise ratio
Related Information
Low-noise current preamplifier capable of current gains as large as 1 pA/V.
Tool Contact
anff-wa@uwa.edu.au
Stanford systems SR 830 DSP lock in amplifier
Lock-in amplifier
University of Western Australia
WA Node
Description
Measures small AC signals that are obscured by large amounts of noise
Related Information
100 kHz measurement range, 10 µs to 30 ks time constants, >100 dB dynamic reserve
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
15 Tesla superconducting cryogenic magnet system
High field superconducting magnet with integrated variable temperature stage
University of Western Australia
WA Node
Description
Measure the carrier concentration and mobility of semiconductor samples at various temperatures using the Hall Effect
Related Information
Resistivity and Hall Effect measurement: conventional probe - temperature range (3-320K); high temperature probe - temperature range (295-600K); optical fibre probe - dark and under steady-state laser illumination @ 1530nm.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
2 Tesla electromagnet system
Electromagnet
University of Western Australia
WA Node
Description
Measure the carrier concentration and mobility of semiconductor samples using the Hall Effect
Related Information
Allows Hall-Effect characterization of semiconductor samples down to liquid Nitrogen temperatures and magnetic field intensity up to 2 Tesla.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Agilent Technologies 4156A Semiconductor Parameter Analyzer
Semiconductor parameter analyser
University of Western Australia
WA Node
Description
Digital sweep parameter. Used for failure analysis and automated incoming inspection.
Related Information
Features four built in source measurement units (SMUs), two voltage monitor units (VMUs) and two Voltage Source Unit (VSU). Current resolution to 1fA and the accuracy of to 20fA.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
AutoLab Potentiostat
More information to come.
Melbourne Centre for Nanofabrication
VIC Node
Description
Precision potentiostat for electrochemical measurements
Related Information
A potentiostat is an analytical instrument designed to control the working electrode's potential in a multiple electrode electrochemical cell.
Tool Contact
mcn-enquiries@nanomelbourne.com
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
B1500A Analyzer- Agilent Technologies
Semiconductor Device Analyser
QLD Node
University of Queensland
Description
Testing of organic and electronic circuits. Provides IV, CV and pulsed measurements of conductive, capacitive, inductive or semiconductor samples
Related Information
Measurements functions: Sweep/spot, multichannel sweep, list sweep, time sampling, quasi-static CV, high frequency CV (to 5 MHz) and a direct control mode. Easyexpert is also supplied with an extensive library of over 230 application tests.
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Custom Probe Station
Four point probe
NSW Node
University of New South Wales
Description
four point probe
Related Information
More information to come.
Tool Contact
anff@unsw.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Electrochemical Suite- Gamry Potentiostats
Electrochemical Testing
Flinders University
SA Node
Description
Eletrochemical Suite for the measurement of the electrical properties of materials for applications such as electrochemical corrosion and battery testing.
Related Information
Potentiostats able to perform many differernt electrochemical tests such as charge/discharge cycles on batteries, cyclic voltammetry, electrochemical impedance spectroscopy (EIS), and corrosion tests.
Tool Contact
Jason.Gascooke@flinders.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
External quantum efficency measure- Custom EQE
External quantum efficiency (EQE) measurement system
Materials Node
University of Newcastle
Description
A measurement system to determine the ability of a solar cell to convert incident photons into electrons at varying wavelengths. Designed to integrate with lab scale devices, this custom system scans from 300 to 1,100 nm and has capacity to extend further in the spectrum.
Related Information
Standard sample size is 12.5 x 17.5 cm.
Tool Contact
anff@newcastle.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Four Point Probe- Keithlink
Probe station
QLD Node
University of Queensland
Description
Provides sheet resistance measurements of metal oxide thin films.
Related Information
Uses high input impedance meter to measure voltage drop when current applied by other two probes.
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Four-Point Probe
More information to come.
Melbourne Centre for Nanofabrication
VIC Node
Description
Jandel multi-height probe stand provides a solution for a wide variety of measurements such as sheet and bulk resistance of the sample. The probe mechanism can be raised and lowered meaning that samples ranging in thickness from thin films to large ingots can be measured.
Related Information
Jandel Engineering Limited offers the RM3000 for use in making four point probe measurements. The RM3000 can supply constant currents between 10nA and 99.99mA, and measure voltages from 0.01mV to 1250mV. For sheet resistance measurements the quoted range is 1 milliohm/square to 5 x 10 (8) ohms/square. For volume (bulk) resistivity measurements the quoted range is 1 milliohm.cm to 1 x 10(6) ohm.cm.
Tool Contact
mcn-enquiries@nanomelbourne.com
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Gooch and Housego OL 750 Spectroradiometric Measurement System
Infrared photodetector responsivity measurement system
University of Western Australia
WA Node
Description
Measures the electrical output per optical input of photodetectors.
Responsivity measures the input–output gain of a detector system. In the specific case of a photodetector, it measures the electrical output per optical input. Most of the photodetectors have strong spectral selectivity in a certain spectrum area. Therefore, for one photodetector, different wavelengths have different spectral responsivity. The spectral responsivity is an important parameter index for characterizing the photodetector performance.
Related Information
Infrared wavelength range characterisation
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Hewlett Packard 3566A dynamic signal analyzer
Spectrum/Network analyzer
University of Western Australia
WA Node
Description
Performs data acquisition, FFT based analysis, raw data recording and report generation for vibration and noise measurement, structural modal test, rotating machinery diagnostics and acoustics.
Measures signals in the frequency domain, allowing to characterise how much energy is present at particular frequencies
Related Information
For fast measurement processing, a powerful hardware signal processor module converts time data to frequency domain data using FFT (Fast Fourier Transform) technology
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Hewlett Packard 4156A parameter analyzer
Parameter analyzer
University of Western Australia
WA Node
Description
All-in-one unit, that consists of power supplies, voltage meters, current meters, switching matrices and LCR meters to test semiconductors devices. Can measure and analyse electrical characteristics of many types of electronic devices, materials, active or passive components, semiconductors, or other kind of electronic equipment.
Related Information
Allows low resistance and low current measurements with voltage resolution down to 0.2 micro volts.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Janis ST-100-UHT-5TXKEL low temperature probe station
Ultra high vacuum micromanipulated probe station
University of Western Australia
WA Node
Description
Used to characterise microelectronic devices in cryogenic and vacuum conditions. Allows non-destructive vacuum and cryogenic probing of wafers (up to 2”) and devices. Micro manipulated triaxial probe arms allow for easy positioning and extremely low leakage current for accurate measurements.
Related Information
Allows low-noise measurements at temperatures ranging from 3.5 Kelvin to 450 Kelvin
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Keithley 4200A-SCS parameter analyzer
Parameter analyzer
University of Western Australia
WA Node
Description
All-in-one unit, that consists of power supplies, voltage meters, current meters, switching matrices and LCR meters to test semiconductors devices. Can measure and analyse electrical characteristics of many types of electronic devices, materials, active or passive components, semiconductors, or other kind of electronic equipment.
Related Information
Allows current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterization.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Lakeshore 336 temperature controller
Cryogenic temperature controller
University of Western Australia
WA Node
Description
Used to control the temperature of semiconductor samples during cryogenic measurements. Cryogenic temperature control unit used to measure and control the temperature of semiconductor samples during cryogenic measurements.
Related Information
Can operate down to 300 mK. Autotuning of PID parameters possible.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Microelectronics/RF Probe Station
More information to come.
Melbourne Centre for Nanofabrication
VIC Node
Description
Microelectronics chacterisation probe station and microscope w/ RF probes
Related Information
More information to come.
Tool Contact
mcn-enquiries@nanomelbourne.com
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Network analyser
More information to come.
Melbourne Centre for Nanofabrication
VIC Node
Description
Network/spectrum analsyer- 9 KHz to 13.6 GHz
Related Information
The R&S ZVL is a compact, powerful, and future-proof network analyser which combine the functions of a network analyzer, spectrum analyzer, and power meter in a single box, and thus tremendously increase work efficiency.
Tool Contact
mcn-enquiries@nanomelbourne.com
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
NKT Photonics SuperK Super Continuum
Photonics Characterisation Suite - Source
Macquarie University
Optofab Node
Description
Super continuum source for optical characterisation.
Related Information
Operates in the visible and near IR regimes.
Tool Contact
benjamin.johnston@mq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Optronic Laboratories Inc. OL 480 Blackbody Source
Blackbody calibration standard
University of Western Australia
WA Node
Description
Emits blackbody radiation for characterizing responsitivity of photodetectors. The OL 480 serves as an accurate, variable temperature (100 to 1200°C) blackbody calibration standard. It is extremely useful for calibrating infrared radiometric and spectroradiometeric measurement systems. The OL 480 has an emmisivity of 0.99 ± 0.01 and an uncertainty in the digital temperature readout of ± 2°C.
Related Information
Accurate and variable temperature (100 to 1200°C) blackbody calibration standard with emmisivity of 0.99 ± 0.01 and an uncertainty in the digital temperature readout of ± 2°C.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Parameter Analyser
More information to come.
Melbourne Centre for Nanofabrication
VIC Node
Description
The 4200A-SCS is a customizable and fully-integrated parameter analyzer that provides synchronized insight into current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterization.
Related Information
The highest performance parameter analyzer, the 4200A-SCS accelerates semiconductor, materials, and process development. The 4200A-SCS ClariusTM GUI-based Software provides clear, uncompromised measurement and analysis capability. Furnished with embedded measurement expertise and hundreds of ready-to-use application tests, Clarius Software enables to dig deeper into R & D with speed and confidence. The 4200A-SCS Parameter Analyzer is completely customizable and fully upgradable, so one can add the instruments one's need now – or later.
Tool Contact
mcn-enquiries@nanomelbourne.com
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Probe Station- Karl Suss PM5
Probe station
NSW Node
University of Sydney
Description
4 probe DC probe station for measuring electrical properties of materials and devices.
Related Information
Substrate size up to 6 inch wafer. Can heat substrate up to 120 degrees centigrade during measurement.
Tool Contact
rpf.queries@sydney.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Probe station- Semiprobe SA-6
Probe station
QLD Node
University of Queensland
Description
Used to probe optoelectronic and semiconductor materials. Integrated into a glovebox system.
Related Information
4 probe DC probe station for measuring electrical properties of materials and devices. Substrate size up to 6 inch wafer.
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Pulse Instruments 7700
Imaging test station
University of Western Australia
WA Node
Description
Characterises the imaging performance of infrared arrays. Carries out radiometric testing of imaging focal plane arrays.
Related Information
Turnkey system with ultra low noise architecture imaging test station providing real-time imaging and correction.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
PV Measurements- QEX7
Quantum efficiency and spectral response measurement system for solar cell measurement
QLD Node
University of Queensland
Description
This Quantum Efficiency(QE)/Spectral Response(SR)/Incident Photon to Current Conversion Efficiency(IPCE)/IV Measurement System is a low-cost, high-performance quantum efficiency measurement system for solar cell analysis. Supplies a calibrated light intensity over known spectrum for testing solar cell efficiency and performance.
Related Information
Scan range 300 - 1100 nm. High resolution scan in <1 min. Probe beam between 1-20 mm. AC and DC measurement modes. Chopping Frequency 1 - 120Hz. Integrated IV measurement.
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Rucker & Kolls 680A Prober
Semi-automatic wafer probe station
University of Western Australia
WA Node
Description
Probe station with B&L Microzoom
Related Information
6 inch chuck with 6 x 6 inch travel. Programmable automatic stepping. Manual mode motorised movement.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Solar Simulator- G2V Sunbrick
Solar Simulator
Flinders University
SA Node
Description
LED Solar Simulator including UV wavelengths down to 350nm. LED intensities can be tuned to simulate various solar spectra experienced on earth.
Related Information
UV-VIS LED solar simulator 300 x 300 mm area. Adjustable solar spectrum to mimic conditions at any lattitde on Earth.
Tool Contact
Jason.Gascooke@flinders.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Solar simulator- Newport Oriel
Solar simulator
Materials Node
University of Newcastle
Description
Tool for comparing the performance of solar cells under standardised conditions
Related Information
AM1.5 AAA rated, 1000W. 25 mm2 centre region. 50 mm collimated beam.
Tool Contact
anff@newcastle.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Stanford systems SR 560 low noise pre-amplifier
Low-noise voltage preamplifier
University of Western Australia
WA Node
Description
Amplifies a very low-power signal without significantly degrading its signal-to-noise ratio
Related Information
High-performance, low-noise preamplifier that is ideal for a wide variety of applications including low-temperature measurements, optical detection, and audio engineering.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Stanford systems SR 570 low noise current amplifier
Low-noise current preamplifier
University of Western Australia
WA Node
Description
Amplifies very low-power signals without significantly degrading their signal-to-noise ratio
Related Information
Low-noise current preamplifier capable of current gains as large as 1 pA/V.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Stanford systems SR 830 DSP lock in amplifier
Lock-in amplifier
University of Western Australia
WA Node
Description
Measures small AC signals that are obscured by large amounts of noise
Related Information
100 kHz measurement range, 10 µs to 30 ks time constants, >100 dB dynamic reserve
Tool Contact
anff-wa@uwa.edu.au
