Electrical Characterisation
Electrical Characterisation
AC and DC characterisation are methods of measuring the electrical properties of a device or circuit. AC characterisation involves applying an alternating current (AC) signal and observing the response in terms of voltage, current, impedance, frequency, and other parameters. DC characterisation involves applying a direct current (DC) signal and observing the response in terms of resistance, power, efficiency, and other factors. Both methods are essential for understanding the performance and limitations of electronic devices and circuits, as the electrical properties often dictate whether the device is performing as expected. This is particularly important for electrical devices, MEMS, and solar cells, where a range of techniques is used to understand different aspects of these properties.
List of available equipment
TOOL MAKE AND MODEL
LOCATION
Blackbody Calibration Standard, Optronic Laboratories Inc. OL 480
ANFF WA
Capacitance-voltage (C-V) measurement system, Four Dimension CV Mapper 92-A
ANFF NSW USYD
Cryogenic Temperature Controller, Lakeshore 336
ANFF WA
Electrochemical Suite, Gamry Potentiostats
ANFF SA Flinders
Electromagnet, Custom
ANFF WA
External quantum efficency measure, Custom EQE
ANFF MATERIALS Newcastle
Four-Point Probe, Jandel RM3000
ANFF VIC MCN
Four point probe station, Custom
ANFF NSW UNSW
High Field Superconducting Magnet with Integrated Variable Temperature Stage, Cryogentic Limited CFMS 15 Tesla
ANFF WA
Imaging Test Station, Pulse Instruments 7700
ANFF WA
Infrared Photodetector Responsivity Measurement System, Gooch and Housego OL 750
ANFF WA
Lock-In Amplifier, Stanford Systems SR 830
ANFF WA
Low Noise Current Amplifier, Stanford systems SR 570
ANFF WA
Low Noise Voltage Preamplifier, Stanford systems SR 560
ANFF WA
Microelectronics/RF Probe Station, Signatone WL
ANFF VIC MCN
Network analyser, Rohde & Schwarz ZVL13
ANFF VIC MCN
NKT Photonics SuperK Super Continuum
ANFF OPTOFAB Macquarie
Parameter Analyser, Hewlett Packard 4156A
ANFF WA
Parameter Analyser, Keithley
ANFF NSW USYD
Parameter Analyser, Keithley 4200A-SCS
ANFF VIC MCN
Parameter Analyser, Keithley 4200A-SCS
ANFF WA
Parameter Analyser, Keithley 4200-SCS
ANFF NSW UNSW
Potentiostat/galvanostat electrochemical system, AutoLab PGSTAT12
ANFF VIC MCN
Probe Station, Karl Suss PM5
ANFF NSW USYD
Probe station, Semiprobe SA-6
ANFF QLD UQ - AIBN
Quantum efficiency and spectral response measurement system, PV Measurements QEX7
ANFF QLD UQ - AIBN
Semi-Automatic Wafer Probe Station, Rucker & Kolls 680A
ANFF WA
Semiconductor device parameter analyser, B1500A analyser Agilent Technologies
ANFF QLD UQ - AIBN
Semiconductor Parameter Analyser, Agilent Technologies 4156A
ANFF WA
Sheet resistivity measurement system, Four Point Probe Keithlink
ANFF QLD UQ - AIBN
Solar Simulator, G2V Sunbrick
ANFF SA Flinders
Solar simulator, Newport Oriel
ANFF MATERIALS Newcastle
Spectrum/Network Analyzer, Hewlett Packard 3566A
ANFF WA
Ultra High Vacuum Micromanipulated Probe Station, Janis ST-100-UHT-5TXKEL
ANFF WA
Wafer prober, SemiProbe PS4L SA6
ANFF NSW USYD
TOOL MAKE AND MODEL
LOCATION
Imaging Test Station, Pulse Instruments 7700
Imaging test station
Description
Characterises the imaging performance of infrared arrays. Carries out radiometric testing of imaging focal plane arrays.
Related Information
Turnkey system with ultra low noise architecture imaging test station providing real-time imaging and correction. Imaging test station
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Blackbody Calibration Standard, Optronic Laboratories Inc. OL 480
Blackbody calibration standard
Description
Emits blackbody radiation for characterising responsitivity of photodetectors. The OL 480 serves as an accurate, variable temperature (100 to 1200°C) blackbody calibration standard. It is extremely useful for calibrating infrared radiometric and spectroradiometeric measurement systems. The OL 480 has an emmisivity of 0.99 ± 0.01 and an uncertainty in the digital temperature readout of ± 2°C.
Related Information
Accurate and variable temperature (100 to 1200°C) blackbody calibration standard with emmisivity of 0.99 ± 0.01 and an uncertainty in the digital temperature readout of ± 2°C. Blackbody calibration standard
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
High Field Superconducting Magnet with Integrated Variable Temperature Stage, Cryogentic Limited CFMS 15 Tesla
High field superconducting magnet with integrated variable temperature stage
Description
Measure the carrier concentration and mobility of semiconductor samples at various temperatures using the Hall Effect
Related Information
Resistivity and Hall Effect measurement: conventional probe - temperature range (3-320K); high temperature probe - temperature range (295-600K); optical fibre probe - dark and under steady-state laser illumination @ 1530nm. High field superconducting magnet with integrated variable temperature stage
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Spectrum/Network Analyzer, Hewlett Packard 3566A
Spectrum/Network analyzer
Description
Performs data acquisition, FFT based analysis, raw data recording and report generation for vibration and noise measurement, structural modal test, rotating machinery diagnostics and acoustics. Measures signals in the frequency domain, allowing to characterise how much energy is present at particular frequencies
Related Information
For fast measurement processing, a powerful hardware signal processor module converts time data to frequency domain data using FFT (Fast Fourier Transform) technology Spectrum/Network analyzer
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Electrochemical Suite, Gamry Potentiostats
Electrochemical Testing
Description
Eletrochemical Suite for the measurement of the electrical properties of materials for applications such as electrochemical corrosion and battery testing.
Related Information
Potentiostats able to perform many differernt electrochemical tests such as charge/discharge cycles on batteries, cyclic voltammetry, electrochemical impedance spectroscopy (EIS), and corrosion tests. Electrochemical Testing
Tool Contact
Jason.Gascooke@flinders.edu.au
TOOL MAKE AND MODEL
LOCATION
Electromagnet, Custom
Electromagnet
Description
Measure the carrier concentration and mobility of semiconductor samples using the Hall Effect
Related Information
Allows Hall-Effect characterisation of semiconductor samples down to liquid Nitrogen temperatures and magnetic field intensity up to 2 Tesla. Electromagnet
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
External quantum efficency measure, Custom EQE
External quantum efficiency (EQE) measurement system
Description
A measurement system to determine the ability of a solar cell to convert incident photons into electrons at varying wavelengths. Designed to integrate with lab scale devices, this custom system scans from 300 to 1,100 nm and has capacity to extend further in the spectrum.
Related Information
Standard sample size is 12.5 x 17.5 cm. External quantum efficiency (EQE) measurement system
Tool Contact
anff@newcastle.edu.au
TOOL MAKE AND MODEL
LOCATION
Four-Point Probe, Jandel RM3000
Description
Jandel multi-height probe stand provides a solution for a wide variety of measurements such as sheet and bulk resistance of the sample. The probe mechanism can be raised and lowered meaning that samples ranging in thickness from thin films to large ingots can be measured.
Related Information
Jandel Engineering Limited offers the RM3000 for use in making four point probe measurements. The RM3000 can supply constant currents between 10nA and 99.99mA, and measure voltages from 0.01mV to 1250mV. For sheet resistance measurements the quoted range is 1 milliohm/square to 5 x 10 (8) ohms/square. For volume (bulk) resistivity measurements the quoted range is 1 milliohm.cm to 1 x 10(6) ohm.cm.
Tool Contact
mcn-enquiries@nanomelbourne.com
TOOL MAKE AND MODEL
LOCATION
Four point probe station, Custom
Four point probe
Description
A custom four-point probe station is designed for precise resistivity and conductivity measurements of thin films, wafers, and semiconductor materials. These systems can be tailored to specific research needs, offering adjustable probe spacing, automated measurement capabilities, and environmental control options.
Related Information
More information to come. Four point probe
Tool Contact
anff@unsw.edu.au
TOOL MAKE AND MODEL
LOCATION
Lock-In Amplifier, Stanford Systems SR 830
Lock-in amplifier
Description
Measures small AC signals that are obscured by large amounts of noise
Related Information
100 kHz measurement range, 10 µs to 30 ks time constants, >100 dB dynamic reserve Lock-in amplifier
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Low Noise Current Amplifier, Stanford systems SR 570
Low-noise current preamplifier
Description
Amplifies very low-power signals without significantly degrading their signal-to-noise ratio
Related Information
Low-noise current preamplifier capable of current gains as large as 1 pA/V. Low-noise current preamplifier
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Low Noise Voltage Preamplifier, Stanford systems SR 560
Low-noise voltage preamplifier
Description
Amplifies a very low-power signal without significantly degrading its signal-to-noise ratio
Related Information
High-performance, low-noise preamplifier that is ideal for a wide variety of applications including low-temperature measurements, optical detection, and audio engineering. Low-noise voltage preamplifier
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Ultra High Vacuum Micromanipulated Probe Station, Janis ST-100-UHT-5TXKEL
Ultra high vacuum micromanipulated probe station
Description
Used to characterise microelectronic devices in cryogenic and vacuum conditions. Allows non-destructive vacuum and cryogenic probing of wafers (up to 2”) and devices. Micro manipulated triaxial probe arms allow for easy positioning and extremely low leakage current for accurate measurements.
Related Information
Allows low-noise measurements at temperatures ranging from 3.5 Kelvin to 450 Kelvin Ultra high vacuum micromanipulated probe station
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Microelectronics/RF Probe Station, Signatone WL
Description
Microelectronics chacterisation probe station and microscope w/ RF probes
Related Information
Tool Contact
mcn-enquiries@nanomelbourne.com
TOOL MAKE AND MODEL
LOCATION
Network analyser, Rohde & Schwarz ZVL13
Description
Network/spectrum analsyer- 9 KHz to 13.6 GHz. It has been designed for precise RF and microwave measurements. It combines the functionality of a network analyser and spectrum analyser, making it ideal for development, production, and service applications.
Related Information
The R&S ZVL is a compact, powerful, and future-proof network analyser which combine the functions of a network analyzer, spectrum analyzer, and power meter in a single box, and thus tremendously increase work efficiency.
Tool Contact
mcn-enquiries@nanomelbourne.com
TOOL MAKE AND MODEL
LOCATION
NKT Photonics SuperK Super Continuum
Photonics Characterisation Suite - Source
Description
Super continuum source for optical characterisation.
Related Information
Operates in the visible and near IR regimes. Photonics Characterisation Suite - Source
Tool Contact
benjamin.johnston@mq.edu.au
TOOL MAKE AND MODEL
LOCATION
Parameter Analyser, Hewlett Packard 4156A
Parameter analyzer
Description
All-in-one unit, that consists of power supplies, voltage meters, current meters, switching matrices and LCR meters to test semiconductors devices. Can measure and analyse electrical characteristics of many types of electronic devices, materials, active or passive components, semiconductors, or other kind of electronic equipment.
Related Information
Allows low resistance and low current measurements with voltage resolution down to 0.2 micro volts. Parameter analyzer
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Parameter Analyser, Keithley
Description
A Parametric Analyser is a device that measures the electrical characteristics of semiconductor devices and materials. It can perform various tests, such as current-voltage (I-V), capacitance-voltage (C-V), and impedance measurements, using a high-precision voltage source and a sensitive current meter. A Parametric Analyser can also generate frequency sweeps, bias ramps, and pulse waveforms to stimulate the device under test and capture its response.
Related Information
Tool Contact
rpf.queries@sydney.edu.au
TOOL MAKE AND MODEL
LOCATION
Parameter Analyser, Keithley 4200A-SCS
Parameter analyzer
Description
All-in-one unit, that consists of power supplies, voltage meters, current meters, switching matrices and LCR meters to test semiconductors devices. Can measure and analyse electrical characteristics of many types of electronic devices, materials, active or passive components, semiconductors, or other kind of electronic equipment.
Related Information
Allows current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterisation. Parameter analyzer
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Parameter Analyser, Keithley 4200A-SCS
Description
The Keithley 4200A-SCS is a fully integrated and customisable semiconductor parameter analyser, offering synchronised current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterisation. Designed for precision electrical testing, it is an essential tool for semiconductor research, reliability testing, and failure analysis, providing comprehensive device and material characterisation in a single platform.
Related Information
The highest performance parameter analyzer, the 4200A-SCS accelerates semiconductor, materials, and process development. The 4200A-SCS ClariusTM GUI-based Software provides clear, uncompromised measurement and analysis capability. Furnished with embedded measurement expertise and hundreds of ready-to-use application tests, Clarius Software enables to dig deeper into R & D with speed and confidence. The 4200A-SCS Parameter Analyzer is completely customisable and fully upgradable, so one can add the instruments one's need now – or later.
Tool Contact
mcn-enquiries@nanomelbourne.com
TOOL MAKE AND MODEL
LOCATION
Parameter Analyser, Keithley 4200-SCS
Description
The Keithley 4200-SCS is a fully integrated and customisable semiconductor parameter analyser, offering synchronised current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterisation. Designed for precision electrical testing, it is an essential tool for semiconductor research, reliability testing, and failure analysis, providing comprehensive device and material characterisation in a single platform.
Related Information
Tool Contact
anff@unsw.edu.au
TOOL MAKE AND MODEL
LOCATION
Potentiostat/galvanostat electrochemical system, AutoLab PGSTAT12
Description
Precision potentiostat for electrochemical measurements
Related Information
A potentiostat is an analytical instrument designed to control the working electrode's potential in a multiple electrode electrochemical cell.
Tool Contact
mcn-enquiries@nanomelbourne.com
TOOL MAKE AND MODEL
LOCATION
Probe Station, Karl Suss PM5
Probe station
Description
4 probe DC probe station for measuring electrical properties of materials and devices.
Related Information
Substrate size up to 6 inch wafer. Can heat substrate up to 120 degrees centigrade during measurement. Probe station
Tool Contact
rpf.queries@sydney.edu.au
TOOL MAKE AND MODEL
LOCATION
Semi-Automatic Wafer Probe Station, Rucker & Kolls 680A
Semi-automatic wafer probe station
Description
Probe station with B&L Microzoom
Related Information
6 inch chuck with 6 x 6 inch travel. Programmable automatic stepping. Manual mode motorised movement. Semi-automatic wafer probe station
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Probe station, Semiprobe SA-6
Probe station
Description
Used to probe optoelectronic and semiconductor materials. Integrated into a glovebox system.
Related Information
4 probe DC probe station for measuring electrical properties of materials and devices. Substrate size up to 6 inch wafer. Probe station
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
LOCATION
Quantum efficiency and spectral response measurement system, PV Measurements QEX7
Quantum efficiency and spectral response measurement system for solar cell measurement
Description
This Quantum Efficiency(QE)/Spectral Response(SR)/Incident Photon to Current Conversion Efficiency(IPCE)/IV Measurement System is a low-cost, high-performance quantum efficiency measurement system for solar cell analysis. Supplies a calibrated light intensity over known spectrum for testing solar cell efficiency and performance.
Related Information
Scan range 300 - 1100 nm. High resolution scan in <1 min. Probe beam between 1-20 mm. AC and DC measurement modes. Chopping Frequency 1 - 120Hz. Integrated IV measurement. Quantum efficiency and spectral response measurement system for solar cell measurement
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
LOCATION
Semiconductor device parameter analyser, B1500A analyser Agilent Technologies
Semiconductor Device Analyser
Description
Testing of organic and electronic circuits. Provides IV, CV and pulsed measurements of conductive, capacitive, inductive or semiconductor samples
Related Information
Measurements functions: Sweep/spot, multichannel sweep, list sweep, time sampling, quasi-static CV, high frequency CV (to 5 MHz) and a direct control mode. Easyexpert is also supplied with an extensive library of over 230 application tests. Semiconductor Device Analyser
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
LOCATION
Semiconductor Parameter Analyser, Agilent Technologies 4156A
Semiconductor parameter analyser
Description
Digital sweep parameter. Used for failure analysis and automated incoming inspection.
Related Information
Features four built in source measurement units (SMUs), two voltage monitor units (VMUs) and two Voltage Source Unit (VSU). Current resolution to 1fA and the accuracy of to 20fA. Semiconductor parameter analyser
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Sheet resistivity measurement system, Four Point Probe Keithlink
Probe station
Description
Provides sheet resistance measurements of metal oxide thin films.
Related Information
Uses high input impedance meter to measure voltage drop when current applied by other two probes. Probe station
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
LOCATION
Solar Simulator, G2V Sunbrick
Solar Simulator
Description
LED Solar Simulator including UV wavelengths down to 350nm. LED intensities can be tuned to simulate various solar spectra experienced on earth.
Related Information
UV-VIS LED solar simulator 300 x 300 mm area. Adjustable solar spectrum to mimic conditions at any lattitde on Earth. Solar Simulator
Tool Contact
Jason.Gascooke@flinders.edu.au
TOOL MAKE AND MODEL
LOCATION
Solar simulator, Newport Oriel
Solar simulator
Description
Tool for comparing the performance of solar cells under standardised conditions
Related Information
AM1.5 AAA rated, 1000W. 25 mm2 centre region. 50 mm collimated beam. Solar simulator
Tool Contact
anff@newcastle.edu.au
TOOL MAKE AND MODEL
LOCATION
Infrared Photodetector Responsivity Measurement System, Gooch and Housego OL 750
Infrared photodetector responsivity measurement system
Description
Measures the electrical output per optical input of photodetectors. Responsivity measures the input–output gain of a detector system. In the specific case of a photodetector, it measures the electrical output per optical input. Most of the photodetectors have strong spectral selectivity in a certain spectrum area. Therefore, for one photodetector, different wavelengths have different spectral responsivity. The spectral responsivity is an important parameter index for characterizing the photodetector performance.
Related Information
Infrared wavelength range characterisation Infrared photodetector responsivity measurement system
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Cryogenic Temperature Controller, Lakeshore 336
Cryogenic temperature controller
Description
Used to control the temperature of semiconductor samples during cryogenic measurements. Cryogenic temperature control unit used to measure and control the temperature of semiconductor samples during cryogenic measurements.
Related Information
Can operate down to 300 mK. Autotuning of PID parameters possible. Cryogenic temperature controller
Tool Contact
anff-wa@uwa.edu.au