Scanning Near Field Optical Microscopy (SNOM)
Scanning Near Field Optical Microscopy (SNOM)
Scanning Near-field Optical Microscopy (SNOM) combines imaging and spectroscopy in the VIS, IR and THz spectral regions at 10 nm spatial resolution. It is used during plasmonic analysis, nanoscale stress and strain testing, and observations of free charge carrier distribution.
List of available equipment
TOOL MAKE AND MODEL
LOCATION
Atomic Force Microscope (AFM), NT-MDT Ntegra Solaris
ANFF OPTOFAB Adelaide
Atomic Force Microscope(AFM) s-SNOM and nano-FTIR, NeaSpec NeaSNOM
ANFF VIC MCN
TOOL MAKE AND MODEL
LOCATION
Atomic Force Microscope (AFM), NT-MDT Ntegra Solaris
Scanning Near-Field Optical Microscope (SNOM) and Atomic Force Microscope (AFM)
Description
The Atomic Force Microscope (AFM) is primarily used to measure and analyse surface topography and morphology, providing nanoscale height measurements.
Related Information
An AFM used for relatively small and flat samples. The maximum scan area is 100 x 100 microns and it can scan features up to 10 microns in height. The SNOM/AFM can run in collection or transmission mode, and is equipped with an IR detector and an in-built red laser. Scanning Near-Field Optical Microscope (SNOM) and Atomic Force Microscope (AFM)
Tool Contact
optofab@adelaide.edu.au
TOOL MAKE AND MODEL
LOCATION
Atomic Force Microscope(AFM) s-SNOM and nano-FTIR, NeaSpec NeaSNOM
Description
The neaSNOM microscope combined with imaging & spectroscopy systems allow us to study chemical, structural and electronic properties of a sample at a spatial resolution of 20nm.
Related Information
Tool Contact
mcn-enquiries@nanomelbourne.com