Scanning Near Field Optical Microscopy (SNOM)
Scanning Near Field Optical Microscopy (SNOM)
Scanning Near-field Optical Microscopy (SNOM) combines imaging and spectroscopy in the VIS, IR and THz spectral regions at 10 nm spatial resolution. It is used during plasmonic analysis, nanoscale stress and strain testing, and observations of free charge carrier distribution.
List of available equipment
TOOL MAKE AND MODEL
LOCATION
Atomic Force Microscope (AFM), NT-MDT Ntegra Solaris
ANFF OPTOFAB Adelaide
Atomic Force Microscope(AFM) s-SNOM and nano-FTIR, NeaSpec NeaSNOM
ANFF VIC MCN