The NeaSNOM is a cutting-edge microscopy system that combines scattering-type scanning near-field optical microscopy (s-SNOM) with nanoscale Fourier transform infrared spectroscopy (nano-FTIR). It offers unparalleled spatial resolution of approximately 10 nm, enabling detailed characterisation of 2D materials, semiconductor nanostructures, and various other specimens. Its applications extend to measuring plasmonic and photonic nanostructures, as well as analysing polymers and biological samples in life sciences.