Other Spectroscopy
Other Spectroscopy
Variations on the theme of spectroscopy provide specific advantages for a range of uses – tweaking of the principle of observing the spectral output of materials in a variety of conditions can provide incredible amounts of information about the composition of a sample.
List of available equipment
TOOL MAKE AND MODEL
LOCATION
Benchtop X-ray Diffractometer, Bruker D2-Phaser XRD instrument
ANFF VIC Latrobe
Cryostat IR Array Characterisation System, Custom IR Characterisation System
ANFF WA
Deep-Level Transient Spectroscopy (DLTS), Custom DLTS
ANFF WA
Matrix-Assisted Laser Desorption/Ionization Time-of-Flight (MALDI-TOF) mass spectrometer, Shimadzu Axima Confidence
ANFF MATERIALS Wollongong
Metastable Induced Electron Spectroscopy System, MIES
ANFF SA Flinders
Nuclear magnetic resonance (NMR) spectrometer, Bruker Avance III
ANFF MATERIALS Wollongong
Photoluminescence test laboratory
ANFF OPTOFAB ANU
Physical Electronics Scanning Auger Nanoprobe, (Physical Electronics 710)
ANFF VIC Latrobe
Raman spectrometer, Jobin Yvon HR800
ANFF MATERIALS Wollongong
Raman spectrometer, Thermo Fisher Scientific Nicolet Almega XR
ANFF QLD UQ - AIBN
Time-of-Flight Secondary Ion Mass Spectrometer (TOF - SIMS DSC), Ion-ToF ToF-SIMS 5-100P
ANFF VIC Latrobe
Time-of-Flight Secondary Ion Mass Spectrometer (TOF - SIMS), GCIS (Ion-ToF ToF-SIMS 5-100P)
ANFF VIC Latrobe
Wafer particle detection system, KLA Surfscan 7700
ANFF QLD Griffith
X-ray fluorescence analyser (XRF), Olympus Delta handheld
ANFF VIC Latrobe
TOOL MAKE AND MODEL
LOCATION
Deep-Level Transient Spectroscopy (DLTS), Custom DLTS
Deep-level transient spectroscopy (DLTS)
Description
Characterisation of semiconductor bandgap energy levels using deep-level transient spectroscopy (DLTS)
Related Information
Custom built equipment. Deep-level transient spectroscopy (DLTS)
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Cryostat IR Array Characterisation System, Custom IR Characterisation System
Cryostat IR array characterisation system
Description
IR transmission/reflection system to characterise spectrometer/filter performance
Related Information
Offers SWIR, MWIR and LWIR characterisation Cryostat IR array characterisation system
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
LOCATION
Matrix-Assisted Laser Desorption/Ionization Time-of-Flight (MALDI-TOF) mass spectrometer, Shimadzu Axima Confidence
MALDI Mass Spectrometer
Description
Characterisation of non-volatile or non-soluble organic materials
Related Information
More information to come. MALDI Mass Spectrometer
Tool Contact
anff-materials@uow.edu.au
TOOL MAKE AND MODEL
LOCATION
Metastable Induced Electron Spectroscopy System, MIES
Metastable Induced electron Spectroscopy
Description
Electron and ion spectrometer used to characterise the electronic structure of surfaces. The instrument also houses a deposition source to make nanoclusters/nanocatalysts.
Related Information
This tool probes the valence orbitals of only the outermost layer of atoms, allowing for the determination of molecule orientation Metastable Induced electron Spectroscopy
Tool Contact
Jason.Gascooke@flinders.edu.au
TOOL MAKE AND MODEL
LOCATION
Nuclear magnetic resonance (NMR) spectrometer, Bruker Avance III
Nuclear magnetic resonance (NMR) spectroscopy
Description
High performance nuclear magnetic resonance system
Related Information
Provides 400 MHz NMR. Autosampling is available. Nuclear magnetic resonance (NMR) spectroscopy
Tool Contact
anff-materials@uow.edu.au
TOOL MAKE AND MODEL
LOCATION
Physical Electronics Scanning Auger Nanoprobe, (Physical Electronics 710)
Description
A precision tool for surface chemistry, the PHI 710 delivers nanometer‑scale elemental and chemical insights. Ideal for semiconductors, thin films, and advanced materials, it combines high resolution with localised imaging to support cutting‑edge research and innovation.
Related Information
Tool Contact
p.pigram@latrobe.edu.au
TOOL MAKE AND MODEL
LOCATION
Raman spectrometer, Jobin Yvon HR800
Raman spectrometer
Description
Capable of high speed Raman mapping
Related Information
405, 534, 633 & 785 nm laser lines, 100cm-1 cut-offs on all lines. 10cm-1 cut-offs on 534 & 633nm lines. Raman spectrometer
Tool Contact
anff-materials@uow.edu.au
TOOL MAKE AND MODEL
LOCATION
Raman spectrometer, Thermo Fisher Scientific Nicolet Almega XR
Dispersive Raman Microscope
Description
Profiles large areas of samples of polymers, coal, and other organic materials.
Related Information
Fourier Transform Raman spectrometer (1064 nm Laser). Collects Raman spectra between 400 - 4000cm-1 Dispersive Raman Microscope
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
LOCATION
Time-of-Flight Secondary Ion Mass Spectrometer (TOF – SIMS DSC), Ion-ToF ToF-SIMS 5-100P
Description
A cutting‑edge surface analysis tool that reveals the chemical makeup of materials at the nanometer scale. Combining TOF‑SIMS with a Gas Cluster Ion Source, it delivers high‑resolution chemical imaging and depth profiling for advanced applications.
Related Information
Tool Contact
p.pigram@latrobe.edu.au
TOOL MAKE AND MODEL
LOCATION
Time-of-Flight Secondary Ion Mass Spectrometer (TOF – SIMS), GCIS (Ion-ToF ToF-SIMS 5-100P)
Description
A cutting‑edge surface analysis tool that reveals the chemical makeup of materials at the nanometer scale. Combining TOF‑SIMS with a Gas Cluster Ion Source, it delivers high‑resolution chemical imaging and depth profiling for advanced applications, in situ FIB.
Related Information
Tool Contact
p.pigram@latrobe.edu.au
TOOL MAKE AND MODEL
LOCATION
Wafer particle detection system, KLA Surfscan 7700
Unpatterned wafer particle/defect inspection system for 150mm wafers.
Description
Fast, fully automatic, jig to jig, non-contact surface measurement. Particle Sensitivity 150nm. Processes Si wafers of 150mm - 675µm
Related Information
Used to determine defects on bare Si, coated Si and patterned wafers. Calibrated by diameter latex spheres on bare silicon. Unpatterned wafer particle/defect inspection system for 150mm wafers.
Tool Contact
glenn.walker@griffith.edu.au