Physical property analysis
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Physical property analysis

A physical property analysis is a process of measuring and evaluating the characteristics of a material or object. Examples of physical properties include density, hardness, colour, melting point, electrical conductivity, refractive index, and thermal expansion. A physical property analysis can help to identify, classify, compare, or select materials for various applications or purposes.

List of available equipment
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Custom infrared/visible spectroscopy system
Infrared transmission mapping system
University of Western Australia WA Node
Description
Provides 2-D surface mapping of infrared transmission of thin film filters. Also used for light beam induced current measurements on semiconductor samples.
Related Information
Infrared spectral range with wideband mercury cadmium telluride detector.
Tool Contact
anff-wa@uwa.edu.au
Dynamic molecular analyser (DMA) Mettler Toledo- SDTA861e
Dynamic mechanical analyser
QLD Node University of Queensland
Description
Investigates the dynamic mechanical behaviour of a material sample as a function of frequency and temperature.
Related Information
Temperature range of -150°C - 500°C with an accuracy of 0.5 K. Maximum peak force of 12N, 18N or 40N and minimum peak force of 0.005N. Frequency range of 0.001 - 1000Hz.
Tool Contact
anff@uq.edu.au
Electromechanical test system- MTS Exceed E44
Tensile and compression testing machine with 30kN load cell
SA Node University of South Australia
Description
Tensile and compression testing machine
Related Information
Tensile and compression testing machine with 30kN load cell
Tool Contact
Simon.Doe@unisa.edu.au
Filmetrics F10-RT thin film analyser
Thin film thickness and refractive index measurement
University of Western Australia WA Node
Description
Simultaneous reflectance/transmittance measurement for characterisation of thin film thickness and refractive index.
Related Information
Wavelength range 380-1050nm; film thickness measurement range 15nm-70um; probe spot size 6mm
Tool Contact
anff-wa@uwa.edu.au
Impact tester- MTS E21
Impact tester for polymers and woods
SA Node University of South Australia
Description
Impact tester to measure of the work done to fracture a test specimen
Related Information
Impact tester for polymers and woods
Tool Contact
Simon.Doe@unisa.edu.au
Impact tester- MTS E22
Impact tester for metals
SA Node University of South Australia
Description
Impact tester to measure of the work done to fracture a test specimen
Related Information
Impact tester for metals
Tool Contact
Simon.Doe@unisa.edu.au
Mettler Toledo DSC 1 STARe System
Differential scanning calorimetry
QLD Node University of Queensland
Description
A system capable of analysing thermal properties of both organic and inorganic materials including glass transition temperature, enthalpy of melting, heat capacity, and thermal degradation.
Related Information
Temperature range ambient to 550°C with a 0.02K precision. Autosampler.
Tool Contact
anff@uq.edu.au
Mettler Toledo TGA/DSC 1 STAR e
Thermogravimetric analysis
QLD Node University of Queensland
Description
Evaluate stepwise changes in mass of polymers and organic compounds with temperature. Also combined with Differential scanning calorimetry to determine the temperature profile of the sample.
Related Information
Observes weight loss of organic and polymer compounds with temperature up to 500°C. Transition temperatures can also be determined.
Tool Contact
anff@uq.edu.au
Micro-VU Vertex 312UC
Coordinate measuring machine
Optofab Node University of Adelaide
Description
A coordinate measuring machine with camera and touch probes.
Related Information
Measurement capacity: 315 x 315 x 250 mm. Scale resolution: 0.1 µm.
Tool Contact
optofab@adelaide.edu.au
MicroXCT Mechanical Testing Stage- Deben CT5000
Tensile and compressive testing stage for micro-CT scans
Flinders University SA Node
Description
Mechanical testing Stage for in-situ tensile and compression testing during CT measurements
Related Information
The mechanical testing stage allows different materials to undergo tensile or compressive loading up to 5 kN (10 mm travel range). Two testing tubes for housing the test specimens are available: -customised carbon glass tube, for specimens up to 10 x 55 mm (height x diameter). Compressive mode, travel= 15-5 mm; tensile mode, travel= 10-20 mm. -Customised aluminium tube, for specimens up to 186 x 70 mm (height x diameter), max 3.5kN load. Compressive mode, travel 186-176 mm.
Tool Contact
Jason.Gascooke@flinders.edu.au
Perkin Elmer STA 6000
Simultaneous thermal analyser (STA)
Optofab Node University of Adelaide
Description
STA simultaneously combines differential thermal analysis (DSC and DTA) with thermo-gravimetric analysis (TGA). STA is commonly used for measuring melting/crystallisation temperature, reaction enthalpies, quantity of volatile content in materials and thermal stabilities
Related Information
Specifications: Temperature range from 15°C to 1000°C; Typical sample size from 5 mg to 100 mg (Up to 1500 mg); Sample purge gases: Argon, Nitrogen, Oxygen or Air. Hyphenated option: STA 6000 can be coupled to FTIR via TL8000 FTIR EGA system for TG-IR analysis for identifying out-gassing products.
Tool Contact
optofab@adelaide.edu.au
Thin Film Stress Measurement System
More information to come.
Melbourne Centre for Nanofabrication VIC Node
Description
The FLX-2320-R is a thin film stress measurement instrument. It accurately measures the changes in the radius of curvature of the substrate caused by the deposition of a stressed thin film on the substrate.
Related Information
The intrinsic stress of a film is mainly caused by the atomic structure mismatch between the film and substrate at the deposition temperature. FLX 2320-R uses a laser interferometer to measure the curvature of a wafer with and without film deposition, which is then used in the calculation of the stress in the film deposited on the wafer. FLX 2320-R has two LASER wavelengths - 670 nm and 750 nm.
Tool Contact
mcn-enquiries@nanomelbourne.com
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Custom infrared/visible spectroscopy system
Infrared transmission mapping system
Melbourne Centre for Nanofabrication VIC Node
Description
Provides 2-D surface mapping of infrared transmission of thin film filters. Also used for light beam induced current measurements on semiconductor samples.
Related Information
Infrared spectral range with wideband mercury cadmium telluride detector.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Dynamic molecular analyser (DMA) Mettler Toledo- SDTA861e
Dynamic mechanical analyser
Melbourne Centre for Nanofabrication VIC Node
Description
Investigates the dynamic mechanical behaviour of a material sample as a function of frequency and temperature.
Related Information
Temperature range of -150°C - 500°C with an accuracy of 0.5 K. Maximum peak force of 12N, 18N or 40N and minimum peak force of 0.005N. Frequency range of 0.001 - 1000Hz.
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Electromechanical test system- MTS Exceed E44
Tensile and compression testing machine with 30kN load cell
Melbourne Centre for Nanofabrication VIC Node
Description
Tensile and compression testing machine
Related Information
Tensile and compression testing machine with 30kN load cell
Tool Contact
Simon.Doe@unisa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Filmetrics F10-RT thin film analyser
Thin film thickness and refractive index measurement
Melbourne Centre for Nanofabrication VIC Node
Description
Simultaneous reflectance/transmittance measurement for characterisation of thin film thickness and refractive index.
Related Information
Wavelength range 380-1050nm; film thickness measurement range 15nm-70um; probe spot size 6mm
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Impact tester- MTS E21
Impact tester for polymers and woods
Melbourne Centre for Nanofabrication VIC Node
Description
Impact tester to measure of the work done to fracture a test specimen
Related Information
Impact tester for polymers and woods
Tool Contact
Simon.Doe@unisa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Impact tester- MTS E22
Impact tester for metals
Melbourne Centre for Nanofabrication VIC Node
Description
Impact tester to measure of the work done to fracture a test specimen
Related Information
Impact tester for metals
Tool Contact
Simon.Doe@unisa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Mettler Toledo DSC 1 STARe System
Differential scanning calorimetry
Melbourne Centre for Nanofabrication VIC Node
Description
A system capable of analysing thermal properties of both organic and inorganic materials including glass transition temperature, enthalpy of melting, heat capacity, and thermal degradation.
Related Information
Temperature range ambient to 550°C with a 0.02K precision. Autosampler.
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Mettler Toledo TGA/DSC 1 STAR e
Thermogravimetric analysis
Melbourne Centre for Nanofabrication VIC Node
Description
Evaluate stepwise changes in mass of polymers and organic compounds with temperature. Also combined with Differential scanning calorimetry to determine the temperature profile of the sample.
Related Information
Observes weight loss of organic and polymer compounds with temperature up to 500°C. Transition temperatures can also be determined.
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Micro-VU Vertex 312UC
Coordinate measuring machine
Melbourne Centre for Nanofabrication VIC Node
Description
A coordinate measuring machine with camera and touch probes.
Related Information
Measurement capacity: 315 x 315 x 250 mm. Scale resolution: 0.1 µm.
Tool Contact
optofab@adelaide.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
MicroXCT Mechanical Testing Stage- Deben CT5000
Tensile and compressive testing stage for micro-CT scans
Melbourne Centre for Nanofabrication VIC Node
Description
Mechanical testing Stage for in-situ tensile and compression testing during CT measurements
Related Information
The mechanical testing stage allows different materials to undergo tensile or compressive loading up to 5 kN (10 mm travel range). Two testing tubes for housing the test specimens are available: -customised carbon glass tube, for specimens up to 10 x 55 mm (height x diameter). Compressive mode, travel= 15-5 mm; tensile mode, travel= 10-20 mm. -Customised aluminium tube, for specimens up to 186 x 70 mm (height x diameter), max 3.5kN load. Compressive mode, travel 186-176 mm.
Tool Contact
Jason.Gascooke@flinders.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Perkin Elmer STA 6000
Simultaneous thermal analyser (STA)
Melbourne Centre for Nanofabrication VIC Node
Description
STA simultaneously combines differential thermal analysis (DSC and DTA) with thermo-gravimetric analysis (TGA). STA is commonly used for measuring melting/crystallisation temperature, reaction enthalpies, quantity of volatile content in materials and thermal stabilities
Related Information
Specifications: Temperature range from 15°C to 1000°C; Typical sample size from 5 mg to 100 mg (Up to 1500 mg); Sample purge gases: Argon, Nitrogen, Oxygen or Air. Hyphenated option: STA 6000 can be coupled to FTIR via TL8000 FTIR EGA system for TG-IR analysis for identifying out-gassing products.
Tool Contact
optofab@adelaide.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Thin Film Stress Measurement System
More information to come.
Melbourne Centre for Nanofabrication VIC Node
Description
The FLX-2320-R is a thin film stress measurement instrument. It accurately measures the changes in the radius of curvature of the substrate caused by the deposition of a stressed thin film on the substrate.
Related Information
The intrinsic stress of a film is mainly caused by the atomic structure mismatch between the film and substrate at the deposition temperature. FLX 2320-R uses a laser interferometer to measure the curvature of a wafer with and without film deposition, which is then used in the calculation of the stress in the film deposited on the wafer. FLX 2320-R has two LASER wavelengths - 670 nm and 750 nm.
Tool Contact
mcn-enquiries@nanomelbourne.com

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    ANFF acknowledges the Traditional Owners of Country throughout Australia and pays respect to Elders past and present. We also acknowledge the First Nations people of Australia as engineers and scientists in whose tradition and footsteps we aspire to follow.

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