A laser beam induced current (LBIC) is a technique that measures the photocurrent generated by a semiconductor device when it is irradiated by a laser beam. LBIC can be used to characterise the spatial distribution of defects, recombination properties, and quantum efficiency of solar cells and photodetectors. LBIC is a non-destructive method that can examine individual devices within large arrays by scanning the laser beam over the device surface and recording the current as a function of position. For electrical devices, MEMS, and solar cells, the electrical properties are often what dictates whether the device is performing as expected. As such there are a range of ways to understand different aspects of these properties.